Fraunhofer Institute for Microstructure of Materials and Systems IMWS
Fraunhofer Institute for Microstructure of Materials and Systems IMWS

Technical Equipment

We offer our customers a comprehensive portfolio of state-of-the-art equipment for the microstructure-based development of optical materials and technologies. We also provide the necessary human resources to make optimum use of our first-class equipment. This includes the aspiration to justify the trust of our customers with our services. With commitment, expertise and creativity, we develop tailor-made solutions for specific problems of today and, with excellent preliminary research, also for the challenges of tomorrow.

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  • All standard laboratory preparation techniques (wire sawing, grinding, polishing, …)
  • Keramographic preparation
  • Laser and ion beam-based techniques for producing cross-sections and target preparations
  • Focused ion beam (FIB) processing for target preparation with nm precision 
  • Plasma FIB (PFIB) processing for target preparation of larger sample volumina 
  • Cryo-ultramicrotomy, rotational microtomy

  • SEM/FIB/PFIB with EDX, WDX & EBSD
  • TEM/STEM (80-300 kV), monochromated, probe and image cs corrector, large-angle EDX, SAD, BF/DF/HAADF STEM detector, low- and high-loss EELS
  • STEM/TEM (80-200 kV), probe cs corrector, large-angle EDX, NBD, BF/DF STEM detector, SE detector, 4D STEM detector
  • TEM/STEM (200 kV), large collecting angle EDX, SAD, BF/DF/HAADF STEM detector

  • Atomic force microscopy (AFM)
  • Photoelectron, UV and Auger electron spectroscopy (XPS/UPS, AES)
  • Time-of-flight secondary ion mass spectrometry (TOF-SIMS), also with gas cluster ion source, heating/cooling stage, sample rotation
  • X-ray fluorescence spectroscopy (XRF)

  • Differential scanning calorimetry (DSC)
  • X-ray diffraction (XRD)X-ray tomography (XCT)
  • UV/VIS, fluorescence and FTIR spectroscopy
  • Inductively coupled plasma mass spectrometry (ICP-MS) and laser-induced breakdown spectroscopy (LIBS)